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Room Temperature deposition of ZnO and Al:ZnO ultrathin films on glass and PET substrates by DC sputtering Technique

机译:在玻璃上室温沉积ZnO和al:ZnO超薄膜   和DC基板溅射技术

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摘要

In the present work, ultrathin films of Zinc oxide (ZnO) and Aluminum dopedzinc oxide (AZO) with 20 nm thick were fabricated at 300 K on glass andPolyethylene terephthalate (PET) substrates by means of directcurrentsputtering method. The structural morphology of the films were analyzed by(XRD) diffractometry. The average transmittance of films deposited on differentsubstrates showed high transparency (over 80%) in the visible spectrum. Theobjective of the present work is to investigate the thicknesses and opticalconstants of ZnO and AZO ultrathin films prepared by DC sputtering onto (glassand PET) substrates using two methods (UV-vis-NIR spectrophotometer andellipsometer (SE) by new amorphous dispersion formula) with comparison to checkand confirm the results that obtained from UV with those obtained from SEmeasurements. The optical constants of films were extracted and compared usingUV and SE techniques in the range of (200- 2200 nm) with increment of 1 nm inorder to confirm the accuracy of the UV and shown an excellent agreement.
机译:在本工作中,通过直流溅射方法在玻璃和聚对苯二甲酸乙二酯(PET)基板上以300 K的厚度制作了厚度为20 nm的氧化锌(ZnO)和铝掺杂的氧化锌(AZO)的超薄膜。通过(XRD)衍射分析膜的结构形态。沉积在不同基板上的薄膜的平均透射率在可见光谱中显示出高透明度(超过80%)。本工作的目的是研究使用两种方法(UV-vis-NIR分光光度计和椭偏仪(SE),通过新的无定形色散公式)通过直流溅射在(玻璃和PET)基板上制备的ZnO和AZO超薄膜的厚度和光学常数,并进行比较。检查并确认从UV获得的结果与从SEmeasurements获得的结果。提取膜的光学常数,并使用UV和SE技术在(200-2200 nm)范围内以1 nm的增量进行比较,以确认UV的准确性,并显示出极好的一致性。

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